Storage reliability evaluation of electronic equipment from accelerated degradation testing

• Published in: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering pp. 859 - 862
• Main Authors: Xuecheng Zhang, Jingrun Ma, Jingsheng Hu, Jingjing Gong
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2012
• Subjects: accelerated degradation testing; Acceleration; Brown motion; Degradation; Electronic equipment; Life estimation; Reliability; reliability evaluation; stochastic process; Stress; Testing
• ISBN: 9781467307864; 1467307866
• DOI: 10.1109/ICQR2MSE.2012.6246362

It is a challenge to evaluate the storage reliability of product with long lifetime and high reliability. Especially, it is very important for the weapon system such as missile which is in long-term storage and one-off use to research the storage reliability. The electronic equipment of such product is prone to fail over long period of storage time. The reliability of electronic equipment should be evaluated in order to adapt to traits of long-storage and usable at any moment. The accelerated degradation testing is utilized to evaluate the storage reliability of electronic equipment in this paper. First, the accelerated drift Brown motion model is established based on the fact that the accelerated degradation of electronic equipment obeys the rule of accelerated model and stochastic process. Second, the storage reliability evaluation model is generated combined with characteristics that the first passage time of linear drift Brown motion presents the inverse Gaussian distribution. In view of the fact that initial reliability of new product is not nicely 1, this model introduces the concept of initial failure. Then methods of maximum likelihood and least squares are used to estimate model parameters at unequal sampling interval. Finally, engineering application validates the proposed method effective.