Quantitative evaluation of mercuric iodide and selenium for X-ray imaging device

• Published in: IEEE Symposium Conference Record Nuclear Science 2004 Vol. 7; pp. 4496 - 4500 Vol. 7
• Main Authors: Byung-Youl Cha, Ji-Koon Park, Sang-Sik Kang, Jung-Wook Shin, Jin-Young Kim, Hyung-Won Lee, Sang-Hee Nam
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2004
• Subjects: Active matrix technology; Amorphous materials; Atherosclerosis; Chemical vapor deposition; Current measurement; Design optimization; Electric variables measurement; Leakage current; Signal to noise ratio; X-ray imaging
• ISBN: 9780780387003; 0780387007
• ISSN: 1082-3654; 2577-0829
• DOI: 10.1109/NSSMIC.2004.1466882

Analog film/screen systems have been replaced with digital X-ray imaging devices using direct conversion materials. In this paper, mercuric iodide (HgI/sub 2/) and amorphous selenium (a-Se) films were deposited through the particle-in-binder (PIB) and physical vapor deposition (PVD) methods, respectively. Using the MCNP 4C code, the interaction of X-ray photons in HgI/sub 2/ and a-Se bulk, their transport, and transmitted energy spectrum of continuous X-ray, with total absorbed energy were simulated. Using I-V measurements, their electrical properties, such as leakage current, X-ray sensitivity, and signal-to-noise ratio (SNR), were investigated. The results of our study can be useful in the future design and optimization of direct active-matrix flat-panel detectors (AMFPD) for various digital X-ray imaging modalities.