The development of a low cost digital spinneret inspection system

Document Withdrawn from IEEE Xplore: The document that would normally appear here has been withdrawn because it contains proprietary information that was not meant to be made public at this time. Reasonable effort should be made to remove all references to this document. We regret any inconvenience.

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Bibliographic Details
Published in2010 IEEE Instrumentation & Measurement Technology Conference Proceedings pp. 1003 - 1007
Main Authors Chun-Jen Chen, Wenyuh Jywe, Min-Wei Hung, Chien-Liang Lin, Hung, J, Lin, T
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2010
Subjects
Charge coupled devices
Charge-coupled image sensors
Costs
Humans
Image processing
Inspection
Lenses
Light sources
optical inspection system
Optical recording
spinneret
System software
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Summary:Document Withdrawn from IEEE Xplore: The document that would normally appear here has been withdrawn because it contains proprietary information that was not meant to be made public at this time. Reasonable effort should be made to remove all references to this document. We regret any inconvenience.
ISBN:1424428327
9781424428328
ISSN:1091-5281
DOI:10.1109/IMTC.2010.5488267