Analysis of metal defectsby distributed cumulative histogram

In this paper an informative distributed cumulative histogram is proposed to analyze a metal and other surfaces having defects. The IDCH is used to illustrate and to measure an intensity and location of defects.

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Bibliographic Details
Published in2018 XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) pp. 18 - 22
Main Authors Melnyk, Roman, Kalychak, Yuriy
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2018
Subjects
defects
distributed cumulative histogram
Feature extraction
histogram
Histograms
Image color analysis
image intensity
Interferometers
Metals
Optical surface waves
Strips
surface
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Summary:In this paper an informative distributed cumulative histogram is proposed to analyze a metal and other surfaces having defects. The IDCH is used to illustrate and to measure an intensity and location of defects.
ISSN:2573-5373
DOI:10.1109/MEMSTECH.2018.8365693