Two sides of pulse quenching effect on the single-event transient pulse width at circuit-level

Pulse quenching effect is evaluated at circuit-level. Simulation results present that pulse quenching effect is not always beneficial to mitigate single-event transient (SET) pulse width. It also could increase the SET pulse width.

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Bibliographic Details
Published in2013 IEEE 10th International Conference on ASIC pp. 1 - 4
Main Authors Bin Liang, Yankang Du
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2013
Subjects
Benchmark testing
Circuit topology
Combinational circuits
Reliability
Simulation
Transient analysis
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Summary:Pulse quenching effect is evaluated at circuit-level. Simulation results present that pulse quenching effect is not always beneficial to mitigate single-event transient (SET) pulse width. It also could increase the SET pulse width.
ISBN:1467364150
9781467364157
ISSN:2162-7541
2162-755X
DOI:10.1109/ASICON.2013.6811956