Comparison between Heavy Ion and Pulsed Laser Simulation to reproduce SEE Tests

• Published in: 2009 Spanish Conference on Electron Devices pp. 246 - 249
• Main Authors: Fernandez-Martinez, P., Lopez-Calle, I., Hidalgo, S., Franco, F.J., Flores, D., de Agapito, J.A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.02.2009
• Subjects: Circuit simulation; Circuit testing; Costs; Electronic equipment testing; Laser modes; Laser theory; Multidimensional systems; Optical pulse generation; Optical pulses; Physics
• ISBN: 9781424428380; 1424428386
• ISSN: 2163-4971
• DOI: 10.1109/SCED.2009.4800477

Single event effects (SEE) produced by highly energetic particle hits on sensitive circuit regions constitutes a main topic in reliability and device performance in space applications. Due to their high cost and limited availability, alternative methods to particle accelerator tests have been develo...