Comparison between Heavy Ion and Pulsed Laser Simulation to reproduce SEE Tests

Single event effects (SEE) produced by highly energetic particle hits on sensitive circuit regions constitutes a main topic in reliability and device performance in space applications. Due to their high cost and limited availability, alternative methods to particle accelerator tests have been develo...

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Bibliographic Details
Published in2009 Spanish Conference on Electron Devices pp. 246 - 249
Main Authors Fernandez-Martinez, P., Lopez-Calle, I., Hidalgo, S., Franco, F.J., Flores, D., de Agapito, J.A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.02.2009
Subjects
Circuit simulation
Circuit testing
Costs
Electronic equipment testing
Laser modes
Laser theory
Multidimensional systems
Optical pulse generation
Optical pulses
Physics
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Summary:Single event effects (SEE) produced by highly energetic particle hits on sensitive circuit regions constitutes a main topic in reliability and device performance in space applications. Due to their high cost and limited availability, alternative methods to particle accelerator tests have been developed. In this sense, pulsed laser test have been shown as an excellent alternative to ion hit experiments in ionization effects studies. This paper evaluate the ability of TCAD simulation to reproduce both, ion hit and pulsed laser incidence effects, as a way to approach the subject and understand the mechanisms of charge generation and SEE production.
ISBN:9781424428380
1424428386
ISSN:2163-4971
DOI:10.1109/SCED.2009.4800477