Discriminative learning of Markov random fields for segmentation of 3D scan data

We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov random fields (MRFs) which support efficient graph-cut inference. The MRF models incorporate a large set of diverse features and enforce the preference that a...

Full description

Saved in:
Bibliographic Details
Published in2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) Vol. 2; pp. 169 - 176 vol. 2
Main Authors Anguelov, D., Taskarf, B., Chatalbashev, V., Koller, D., Gupta, D., Heitz, G., Ng, A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2005
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov random fields (MRFs) which support efficient graph-cut inference. The MRF models incorporate a large set of diverse features and enforce the preference that adjacent scan points have the same classification label. We use a recently proposed maximum-margin framework to discriminatively train the model from a set of labeled scans; as a result we automatically learn the relative importance of the features for the segmentation task. Performing graph-cut inference in the trained MRF can then be used to segment new scenes very efficiently. We test our approach on three large-scale datasets produced by different kinds of 3D sensors, showing its applicability to both outdoor and indoor environments containing diverse objects.
ISBN:0769523722
9780769523729
ISSN:1063-6919
1063-6919
DOI:10.1109/CVPR.2005.133