Frequency-Dependent Dielectric Constant and Loss Tangent Characterization of Thin Dielectrics Using a Rapid Solver

The electrical performance of both digital interconnects and embedded RF passives mostly depend on the electrical properties of dielectric materials used in packages and printed circuit boards. The dielectric constant and loss tangent vary as a function of frequency. They need to be accurately extra...

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Bibliographic Details
Published in2007 Proceedings 57th Electronic Components and Technology Conference pp. 792 - 797
Main Authors Engin, A.E., Tambawala, A., Swaminathan, M., Bhattacharya, S., Pramanik, P., Yamazaki, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2007
Subjects
Curve fitting
Dielectric constant
Dielectric losses
Dielectric materials
Dielectric measurements
Integrated circuit interconnections
Material properties
Packaging
Printed circuits
Radio frequency
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Summary:The electrical performance of both digital interconnects and embedded RF passives mostly depend on the electrical properties of dielectric materials used in packages and printed circuit boards. The dielectric constant and loss tangent vary as a function of frequency. They need to be accurately extracted in a broad frequency range for successful design of high-performance systems. In this paper, we present a new extraction technique based on the measurement of a rectangular plane pair and curve fitting using a rapid solver. This method is especially applicable to extremely thin dielectric materials that have become available recently. We show the sensitivity of the method to variations in the materials properties, as well as the development of a causal model consistent with Kramers-Kronig relations. This method can be applied to materials with both low and high dielectric constants.
ISBN:9781424409846
1424409845
ISSN:0569-5503
2377-5726
DOI:10.1109/ECTC.2007.373888