Validating the transmission-line based material property extraction procedure including surface roughness for multilayer PCBs using simulations

Accurate frequency-dependent dielectric properties are important for accurate modeling of signal and power integrity problems. One method for extracting dielectric properties from fabricated multilayer printed circuit boards is based on the measured electrical property of fabricated transmission lin...

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Bibliographic Details
Published in2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) pp. 472 - 477
Main Authors Shuai Jin, Xiang Fang, Bichen Chen, Han Gao, Xiaoning Ye, Jun Fan
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2016
Subjects
Attenuation
conductor roughness
Conductors
Dielectric losses
electrical property of transmission line
Material properties
material property extraction
procedure validation
Propagation constant
Rough surfaces
sensitivity analysis
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Summary:Accurate frequency-dependent dielectric properties are important for accurate modeling of signal and power integrity problems. One method for extracting dielectric properties from fabricated multilayer printed circuit boards is based on the measured electrical property of fabricated transmission lines, denoted the "Root-omega" method. In this paper, the "Root-omega" method applied to the cases with smooth and rough conductors is validated using simulations. Potential errors in the procedure are discussed.
ISSN:2158-1118
DOI:10.1109/ISEMC.2016.7571694