APA (7th ed.) Citation

Rodriguez, M., Claudio, A., Theilliol, D., & Vela, L. (2007, June). A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring. 2007 IEEE Power Electronics Specialists Conference, 1001-1005. https://doi.org/10.1109/PESC.2007.4342127

Chicago Style (17th ed.) Citation

Rodriguez, M.A, A. Claudio, D. Theilliol, and L.G Vela. "A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring." 2007 IEEE Power Electronics Specialists Conference Jun. 2007: 1001-1005. https://doi.org/10.1109/PESC.2007.4342127.

MLA (9th ed.) Citation

Rodriguez, M.A, et al. "A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring." 2007 IEEE Power Electronics Specialists Conference, Jun. 2007, pp. 1001-1005, https://doi.org/10.1109/PESC.2007.4342127.