Noise Modeling For Charge Amplification and Sampling

A new cyclostationarity-based analytical model for noise analysis of a charge amplifier followed by a correlated double sampling (CDS) circuit is proposed. It determines output noise (power spectral density and squared voltage) resulting from input noise voltages and currents. Model validation is pe...

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Bibliographic Details
Published in2006 13th IEEE International Conference on Electronics, Circuits and Systems pp. 9 - 12
Main Authors Pittet, P., Guo-Neng Lu, Quiquerez, L.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2006
Subjects
Analytical models
Capacitive sensors
Circuit noise
Circuit simulation
Frequency domain analysis
Instruments
Photodetectors
Sampling methods
Signal to noise ratio
Voltage
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Summary:A new cyclostationarity-based analytical model for noise analysis of a charge amplifier followed by a correlated double sampling (CDS) circuit is proposed. It determines output noise (power spectral density and squared voltage) resulting from input noise voltages and currents. Model validation is performed by comparing the obtained results with those of temporal noise simulations. This model allows analysis of consequences of CDS and integration duration on noise contributions. It predicts that CDS does not suppress or attenuate effect of input current sources. In the case of 1/f input noise current, the SNR can not be improved by increasing the integration duration.
ISBN:9781424403943
1424403944
DOI:10.1109/ICECS.2006.379668