Development of device under test (DUT) board of LM741 op-amp IC for test development and measurement track of Mapua University

This work aims to design and develop a DUT board for an 8-pin LM741 Op-amp Integrated Circuit. The created board will be used by the Test Development and Measurement Track of Mapua University. This will be a new testing board that will help the students to explore more about Op-amp's DC and AC...

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Bibliographic Details
Published in2017IEEE 9th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment and Management (HNICEM) pp. 1 - 4
Main Authors Latina, Mary Ann E., Baking, Dawn Howard L., Fernandez, Jed Emery S., Guevarra, Allen Davey R., Rastrullo, Raffy James R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2017
Subjects
Integrated circuits
Layout
Operational amplifiers
Pins
Semiconductor device measurement
Testing
Voltage measurement
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Summary:This work aims to design and develop a DUT board for an 8-pin LM741 Op-amp Integrated Circuit. The created board will be used by the Test Development and Measurement Track of Mapua University. This will be a new testing board that will help the students to explore more about Op-amp's DC and AC parameters such as Input Offset Voltage, Input Offset Current, Common-Mode Rejection Ratio, Power-Supply Rejection Ratio, Open-Loop Gain, Positive and Negative Voltage Swing, Slew Rate, and Settling Time. The creation of this design will further enhance the understanding and skills of the students in using CTS5010 resources and creating test programs. The created board is evaluated through the comparison of the results of breadboard setup and DUT board setup, the gathered data is statistically analyzed using two-sample t-test. Using 95% confidence level, the calculated t-value is compared to the 5% significance level of t-distribution table.
DOI:10.1109/HNICEM.2017.8269436