Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.

Saved in:
Bibliographic Details
Published in2011 IEEE Radiation Effects Data Workshop pp. 1 - 8
Main Authors Hafer, C., Lahey, M., Harris, D., Larsen, J., Sievert, F., Sims, T., Meyer, S., Dumitru, R., Jordan, A., Milliken, P.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2011
Subjects
Application specific integrated circuits
Arrays
Logic gates
Performance evaluation
Power supplies
Springs
Tin
Online AccessGet full text

Cover

More Information
Summary:Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.
ISBN:1457712814
9781457712814
ISSN:2154-0519
DOI:10.1109/REDW.2010.6062506