Compendia of radiation test results of integrated circuits

Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.

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Bibliographic Details
Published inIEEE Radiation Effects Data Workshop, 2005 pp. 156 - 162
Main Authors Layton, P., Patnaude, E., Williamson, G., Longden, L., Sloan, C.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2005
Subjects
Circuit testing
Cyclotrons
EPROM
Gold
Integrated circuit testing
Ionizing radiation
Logic
Performance evaluation
Single event upset
Temperature
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Summary:Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
ISBN:9780780393677
0780393678
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2005.1532683