Lou, M., Zhou, J., Wen, L., Feng, W., & Lee, J. (2010, August). System level drop reliability method research for netbook memory module. 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, 1043-1048. https://doi.org/10.1109/ICEPT.2010.5582716
Chicago Style (17th ed.) CitationLou, Minyi, Jianwei Zhou, Long Wen, Weiwei Feng, and Jaisung Lee. "System Level Drop Reliability Method Research for Netbook Memory Module." 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging Aug. 2010: 1043-1048. https://doi.org/10.1109/ICEPT.2010.5582716.
MLA (9th ed.) CitationLou, Minyi, et al. "System Level Drop Reliability Method Research for Netbook Memory Module." 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, Aug. 2010, pp. 1043-1048, https://doi.org/10.1109/ICEPT.2010.5582716.