Structural and optical properties of ZnTe thin films

• Published in: CAS 2012 (International Semiconductor Conference) Vol. 2; pp. 321 - 324
• Main Authors: Potlog, T., Maticiuc, N., Mirzac, A., Dumitriu, P., Scortescu, D.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.10.2012
• Subjects: Absorption; Optical diffraction; Optical films; optical properties; structural properties; Substrates; X-ray diffraction; X-ray scattering; ZnTe thin films
• DOI: 10.1109/SMICND.2012.6400772
• ISBN: 9781467307376; 1467307378
• ISSN: 1545-827X

Thin films of ZnTe have been prepared by close spaced sublimation technique. The deposited films have been characterized by using optical absorption, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Structural investigations performed by X-ray diffraction technique showed that studied samples are polycrystalline and have a cubic (zinc blende) structure. XRD patterns have been used to determine the microstructural parameters (crystallite size, lattice parameter) of investigated films. Surface morphology studies SEM shows that the grains are uniformly distributed over the entire surface of the substrate. Optical properties of ZnTe films were studied extensively in the range of incident photon energy (0.5-4.0) eV. In the studied ZnTe films the direct transitions take place.