Structural and optical properties of ZnTe thin films

Thin films of ZnTe have been prepared by close spaced sublimation technique. The deposited films have been characterized by using optical absorption, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Structural investigations performed by X-ray diffraction technique showed that studied...

Full description

Saved in:
Bibliographic Details
Published inCAS 2012 (International Semiconductor Conference) Vol. 2; pp. 321 - 324
Main Authors Potlog, T., Maticiuc, N., Mirzac, A., Dumitriu, P., Scortescu, D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2012
Subjects
Absorption
Optical diffraction
Optical films
optical properties
structural properties
Substrates
X-ray diffraction
X-ray scattering
ZnTe thin films
Online AccessGet full text

Cover

More Information
Summary:Thin films of ZnTe have been prepared by close spaced sublimation technique. The deposited films have been characterized by using optical absorption, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Structural investigations performed by X-ray diffraction technique showed that studied samples are polycrystalline and have a cubic (zinc blende) structure. XRD patterns have been used to determine the microstructural parameters (crystallite size, lattice parameter) of investigated films. Surface morphology studies SEM shows that the grains are uniformly distributed over the entire surface of the substrate. Optical properties of ZnTe films were studied extensively in the range of incident photon energy (0.5-4.0) eV. In the studied ZnTe films the direct transitions take place.
ISBN:9781467307376
1467307378
ISSN:1545-827X
2377-0678
DOI:10.1109/SMICND.2012.6400772