A general procedure for extraction of bias dependent dynamic self heating model parameters
A general method for characterizing electrothermal interaction due to self heating is proposed. The characterization is performed using only electrical measurements and is directly applicable to a wide range of device technologies. A rigorous small-signal analysis of the electrothermal problem forms...
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Published in | IEEE MTT-S International Microwave Symposium Digest, 2005 pp. 1159 - 1162 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2005
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Subjects | |
Online Access | Get full text |
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