Transient simulation of UTC-PD using drift-diffusion model

In this paper, the reliability of transient simulation results of uni-traveling-carrier photodiodes (UTC-PDs) is demonstrated by compared with experimental and reported simulation results, when the parameters of drift-diffusion model are set correctly.

Saved in:
Bibliographic Details
Published in2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) pp. 139 - 140
Main Authors Tao Liu, Yongqing Huang, Qingtao Chen, Jiarui Fei, Kai Liu, Xiaofeng Duan, Xiaomin Ren
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2017
Subjects
Electric fields
Mathematical model
Numerical models
Photodiodes
Simulation
Transient analysis
Online AccessGet full text

Cover

More Information
Summary:In this paper, the reliability of transient simulation results of uni-traveling-carrier photodiodes (UTC-PDs) is demonstrated by compared with experimental and reported simulation results, when the parameters of drift-diffusion model are set correctly.
ISSN:2158-3242
DOI:10.1109/NUSOD.2017.8010030