Computer controlled measurement of power MOSFET transient thermal response

A measurement system for the computer controlled power MOSFET transient thermal response is presented. On the basis of a measured semiconductor's temperature sensitive parameter (TSEP), the transient thermal impedance curve (TTIC) is calculated. Using THERM software and TTIC measured points, an...

Full description

Saved in:
Bibliographic Details
Published inPESC '92 Record. 23rd Annual IEEE Power Electronics Specialists Conference pp. 1025 - 1032 vol.2
Main Author Jakopovic, Z.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1992
Subjects
Cogeneration
Electrical resistance measurement
Impedance
MOSFET circuits
Power measurement
Power MOSFET
Pulse measurements
Resistance heating
Temperature measurement
Thermal resistance
Online AccessGet full text

Cover

More Information
Summary:A measurement system for the computer controlled power MOSFET transient thermal response is presented. On the basis of a measured semiconductor's temperature sensitive parameter (TSEP), the transient thermal impedance curve (TTIC) is calculated. Using THERM software and TTIC measured points, an identification of the semiconductor's thermal model equivalent parameters is provided. A comparison of measured and approximated TTIC shows that the procedure is very exact.< >
ISBN:9780780306950
0780306953
DOI:10.1109/PESC.1992.254771