A Monte Carlo study of magnetic domain images in a spin-polarized scanning electron microscope

There are few theoretical works to analyze the signals used in the spin-polarized scanning electron microscope. We have developed a Monte Carlo simulation model of electron scattering in magnetic materials and analyzed several characteristics of spin-polarized secondary electron emission. In this wo...

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Bibliographic Details
Published inDigest of Papers. Microprocesses and Nanotechnology 2001. 2001 International Microprocesses and Nanotechnology Conference (IEEE Cat. No.01EX468) pp. 242 - 243
Main Authors Yasuda, M., Katsuse, R., Kawata, H., Murata, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2001
Subjects
Electron emission
Magnetic analysis
Magnetic domains
Magnetic force microscopy
Magnetic materials
Monte Carlo methods
Probes
Scanning electron microscopy
Scattering
Spatial resolution
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Summary:There are few theoretical works to analyze the signals used in the spin-polarized scanning electron microscope. We have developed a Monte Carlo simulation model of electron scattering in magnetic materials and analyzed several characteristics of spin-polarized secondary electron emission. In this work we study the magnetic domain images in the spin-polarized scanning electron microscope with the Monte Carlo simulation.
ISBN:4891140178
9784891140175
DOI:10.1109/IMNC.2001.984180