Fault characterisation of complementary pass-transistor logic circuits

• Published in: 2000 IEEE International Conference on Semiconductor Electronics Proceedings pp. 80 - 84
• Main Authors: Aziz, S.M., Harun-ur Rashid, A.B.M., Karim, M.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2000
• Subjects: Circuit faults; Circuit testing; CMOS logic circuits; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Monitoring; Power engineering and energy; Threshold voltage
• ISBN: 9780780364301; 0780364309
• DOI: 10.1109/SMELEC.2000.932438

Complementary pass-transistor logic (CPL) circuits result in speed improvement and power reduction compared to conventional static CMOS logic. However, the behaviour of this logic family under fault has not yet been studied. This paper presents the results of an investigation into the behaviour of C...