An optimal multiline TRL calibration algorithm

We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: the popular multiline TRL algorithm implemented in the MultiCal/spl reg/ software package, and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement...

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Bibliographic Details
Published inIEEE MTT-S International Microwave Symposium Digest, 2003 Vol. 3; pp. 1819 - 1822 vol.3
Main Authors Williams, D.F., Wang, C.M., Arz, U.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2003
Subjects
Algorithm design and analysis
Calibration
Iterative algorithms
Iterative methods
Noise measurement
Probes
Scattering parameters
Software algorithms
Software packages
Transmission line matrix methods
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Summary:We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: the popular multiline TRL algorithm implemented in the MultiCal/spl reg/ software package, and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise, and verify its uncertainty estimates.
ISBN:9780780376953
0780376951
ISSN:0149-645X
2576-7216
DOI:10.1109/MWSYM.2003.1210494