Cmos built-in test architecture for high-speed jitter measurement

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Bibliographic Details
Published in	International Test Conference, 2003. Proceedings. ITC 2003 Vol. 1; pp. 67 - 76
Main Authors	Lin, H.C., Taylor, K., Chong, A., Chan, E., Soma, M., Haggag, H., Huard, J., Braat, J.
Format	Conference Proceeding
Language	English
Published	IEEE 2003
Subjects	Built-in self-test Clocks Costs Delay Jitter Noise measurement Phase measurement Semiconductor device measurement Testing Voltage
Online Access	Get full text

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