Statistically aware buffer planning

In this paper, we will develop an analytic approach to estimate the statistical properties (mean and variance) of the performance of a uniformly buffered global IC interconnect, based on the mean and (co)variance of the appropriate design and technology parameters. Compared to other approaches, such...

Full description

Saved in:
Bibliographic Details
Published inProceedings Design, Automation and Test in Europe Conference and Exhibition Vol. 2; pp. 1402 - 1403 Vol.2
Main Authors Garcea, G.S., van der Meijs, N.P., van der Kolk, K.-J., Otten, R.H.J.M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
Analysis of variance
Appropriate technology
Design optimization
Measurement standards
Monte Carlo methods
Performance analysis
Random variables
Stress
Taylor series
Velocity measurement
Online AccessGet full text

Cover

More Information
Summary:In this paper, we will develop an analytic approach to estimate the statistical properties (mean and variance) of the performance of a uniformly buffered global IC interconnect, based on the mean and (co)variance of the appropriate design and technology parameters. Compared to other approaches, such as Monte Carlo based approaches, our analytic approach would allow a much tighter design optimization loop and provide a better insight in the factors involved. The model that we use is generic, but in this paper we assume a set of synthetic (not based on actual process data) but realistically large values for the variability of the input parameters. Under these assumptions, it follows that solutions for the area/power/performance tradeoff that are optimal in a deterministic setting, might suffer from excessive variability, potentially leading to a yield problem.
ISBN:0769520855
9780769520858
ISSN:1530-1591
1558-1101
DOI:10.1109/DATE.2004.1269107