AMLETO: a multi-language environment for functional test generation

• Published in: Proceedings International Test Conference 2001 (Cat. No.01CH37260) pp. 821 - 829
• Main Authors: Fin, A., Fummi, F., Pravadelli, G.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2001
• Subjects: Computational modeling; Delay; Electronic design automation and methodology; Embedded system; Error correction; Hardware design languages; History; Power system modeling; Software testing; System testing
• ISBN: 0780371690; 9780780371699
• ISSN: 1089-3539; 2378-2250
• DOI: 10.1109/TEST.2001.966704

More and more people are starting to use the SystemC description language to model and simulate new designs. This is due mainly to the simplicity and power of the language. The number of models written in SystemC currently available is still very limited and testing SystemC descriptions is still an open issue, since the language is new and researchers are looking for efficient error models and coverage metrics. This paper presents AMLETO, a multi-language environment developed to efficiently test embedded systems and IP-Cores. Using IIR, an HDL language independent representation, it supplies: fast translation from VHDL to SystemC of design descriptions and viceversa, generation and setup of customized TPGs for the design under test and generation of erroneous models capable of simulating the presence of design errors.