A built-in self-repair analyzer (CRESTA) for embedded DRAMs

A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum opera...

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Bibliographic Details
Published inProceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) pp. 567 - 574
Main Authors Kawagoe, T., Ohtani, J., Niiro, M., Ooishi, T., Hamada, M., Hidaka, H.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2000
Subjects
Algorithm design and analysis
Automatic testing
Built-in self-test
Costs
Failure analysis
Large scale integration
Manufacturing
Production management
Random access memory
Ultra large scale integration
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Summary:A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum operation speed around 200 MHz+.
ISBN:0780365461
9780780365469
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2000.894250