Synthesis of sequential circuits with clock control to improve testability
We propose a new synthesis technique for finite state machines that improves their testability by disabling the clock to a subset of the flip-flops. Distance-matrix results with and without the clock control demonstrate dramatic improvement in the average and worst-case distances between pairs of st...
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Published in | Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) pp. 472 - 477 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1998
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Subjects | |
Online Access | Get full text |
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Summary: | We propose a new synthesis technique for finite state machines that improves their testability by disabling the clock to a subset of the flip-flops. Distance-matrix results with and without the clock control demonstrate dramatic improvement in the average and worst-case distances between pairs of states. The experimental results using available sequential ATPG tools further verify that the scheme allows significantly shorter tests to be generated with comparable fault coverage. |
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ISBN: | 9780818682773 0818682779 |
ISSN: | 1081-7735 2377-5386 |
DOI: | 10.1109/ATS.1998.741659 |