PASTEL: a parameterized memory characterization system

PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input...

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Bibliographic Details
Published inProceedings Design, Automation and Test in Europe pp. 15 - 20
Main Authors Ogawa, K., Kohno, M., Kitamura, F.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1998
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Summary:PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input vector generation, waveform measurement, data-sheet and library creation. The circuit reduction scheme can reduce the circuit simulation time by 2 order of magnitude while maintaining delay error within 100 ps of exact simulation.
ISBN:9780818683596
0818683597
DOI:10.1109/DATE.1998.655831