PASTEL: a parameterized memory characterization system
PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input...
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Published in | Proceedings Design, Automation and Test in Europe pp. 15 - 20 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1998
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Subjects | |
Online Access | Get full text |
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Summary: | PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input vector generation, waveform measurement, data-sheet and library creation. The circuit reduction scheme can reduce the circuit simulation time by 2 order of magnitude while maintaining delay error within 100 ps of exact simulation. |
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ISBN: | 9780818683596 0818683597 |
DOI: | 10.1109/DATE.1998.655831 |