Evanescent microwave sensor scanning for detection of sub-surface defects in wires

Evanescent microwave probe (EMP) scanning is used to detect sub-surface defects in copper wire with high dielectric coatings. The primary interest is in winding wire used in the construction of high voltage motors, generators and transformer applications although this technique can be applied to oth...

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Bibliographic Details
Published inProceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.01CH37264) pp. 245 - 250
Main Authors Kleismit, R.A., Kazimierczuk, M.K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2001
Subjects
Coaxial components
Conductors
Microwave imaging
Microwave sensors
Power transmission lines
Probes
Resonance
Spatial resolution
Transmission line theory
Wire
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Summary:Evanescent microwave probe (EMP) scanning is used to detect sub-surface defects in copper wire with high dielectric coatings. The primary interest is in winding wire used in the construction of high voltage motors, generators and transformer applications although this technique can be applied to other aspects of stress and flaw detection. Evanescent microwave probes have the unique ability to image subsurface features under poorly conducting or dielectric materials. This nondestructive evaluation technique will allow fast and highly accurate subsurface scans of armature or stator wire in inspecting for various surface anomalies.
ISBN:0780371801
9780780371804
ISSN:0362-2479
DOI:10.1109/EEIC.2001.965618