Improvements in dielectric measurements with a resonant cavity

A description is given of the use of an automatic network analyzer (ANA) which determines with very high accuracy the resonant frequency and intrinsic quality factor of a microwave resonant cavity. With this technique, the complex permittivity of dielectric material samples can be measured with low...

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Bibliographic Details
Published in[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference pp. 573 - 579
Main Authors Estin, A.J., Janezic, M.D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1991
Subjects
Calibration
Chromium
Dielectric materials
Dielectric measurements
Paper technology
Permittivity
Q factor
Reflection
Resonance
Resonant frequency
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Summary:A description is given of the use of an automatic network analyzer (ANA) which determines with very high accuracy the resonant frequency and intrinsic quality factor of a microwave resonant cavity. With this technique, the complex permittivity of dielectric material samples can be measured with low uncertainty. The methods described make use of the high speed and built-in mismatch correction capability of an ANA.< >
ISBN:9780879425791
0879425792
DOI:10.1109/IMTC.1991.161660