A novel approach to delay-fault diagnosis

The authors discuss possibilities of delay fault diagnosis based on fault simulation. They detail the proposed approach based on critical path tracing. A path tracing process is presented with information provided by a logic simulation. Due to the limitations induced by such a simulation, a reliable...

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Bibliographic Details
Published in[1992] Proceedings 29th ACM/IEEE Design Automation Conference pp. 357 - 360
Main Authors Girard, P., Landrault, C., Pravossoudovitch, S.
Format Conference Proceeding
LanguageEnglish
Published IEEE Comput. Soc. Press 1992
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ISBN9780818628221
0818628227
ISSN0738-100X
DOI10.1109/DAC.1992.227778

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Summary:The authors discuss possibilities of delay fault diagnosis based on fault simulation. They detail the proposed approach based on critical path tracing. A path tracing process is presented with information provided by a logic simulation. Due to the limitations induced by such a simulation, a reliable approach is described based on a six-valued logic simulation. It requires no delay size based fault models and considers only the fault-free circuit. This method is an alternative to fault simulation based approaches and provides perfectly reliable results. It does not require timing evaluations and can be very accurate.< >
ISBN:9780818628221
0818628227
ISSN:0738-100X
DOI:10.1109/DAC.1992.227778