Study of the conductance and structure characteristics of C60/Sb bilayers

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Bibliographic Details
Published inJournal of physics. Condensed matter Vol. 13; no. 18; pp. 3987 - 4000
Main Authors Li, Xiang, Wang, H, Wang, W N, Tang, Y J, Zhao, H W, Zhan, W S, Hou, J G
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 07.05.2001
Institute of Physics
Subjects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport in interface structures
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Temperature dependence
Atomic force microscopy
Order-disorder transformations
Annealing
Electrical conductivity
Doping
Antimony
Experimental study
Contamination
Thin films
Fullerenes
Anomaly
Microstructure
TEM
Bilayers
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/13/18/309