FOSS as an efficient tool for extraction of MOSFET compact model parameters

A GNU Octave - based application for device-level compact model evaluation and parameter extraction has been developed. The applications main features are as follows: experimental I-V data importing, generating input data for different circuit simulation programs, running the simulation program to c...

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Bibliographic Details
Published in2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems pp. 68 - 73
Main Authors Tomaszewski, Daniel, Gluszko, Grzegorz, Kuznetsov, Vadim, Brinson, Mike, Grabinski, Wladek
Format Conference Proceeding
LanguageEnglish
Published Department of Microelectronics and Computer Science, Lodz University of Technology 01.06.2016
Subjects
CMOS
Data models
EDA tools
FOSS
GNU Octave
Integrated circuit modeling
Logic gates
Model evaluation
MOSFET
Parameter extraction
Semiconductor device modeling
Software
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Summary:A GNU Octave - based application for device-level compact model evaluation and parameter extraction has been developed. The applications main features are as follows: experimental I-V data importing, generating input data for different circuit simulation programs, running the simulation program to calculate I-V characteristics of the specified models, calculating model misfit and its sensitivity to selected parameter variation, and the comparison of experimental and simulated characteristics. Measured I-V data stored by different measurement systems are accepted. Circuit simulations may be done with Ngspice, Qucs and LTSpiceIV © . Selected aspects of the application are presented and discussed.
DOI:10.1109/MIXDES.2016.7529702