Terahertz dielectric response of ferroelectric baxsr1-xtio3 thin films
Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric Ba x Sr 1-x TiO 3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm...
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Published in | IEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 58; no. 11; pp. 2276 - 2280 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.11.2011
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric Ba x Sr 1-x TiO 3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba x Sr 1-x TiO 3 thin films varies with the films compositions. Among the compositions of Ba x Sr 1-x TiO 3 films with different Ba/Sr ratios, Ba 0.6 Sr 0.4 TiO 3 has the highest dielectric constants and the shortest dielectric relaxation time. |
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ISSN: | 0885-3010 1525-8955 |
DOI: | 10.1109/TUFFC.2011.2084 |