Terahertz dielectric response of ferroelectric baxsr1-xtio3 thin films

Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric Ba x Sr 1-x TiO 3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm...

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Published inIEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 58; no. 11; pp. 2276 - 2280
Main Authors Kang, Seung Beom, Kwak, Min Hwan, Choi, Muhan, Kim, Sungil, Kim, Taeyong, Cha, Eun Jong, Kang, Kwang Yong
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.11.2011
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric Ba x Sr 1-x TiO 3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba x Sr 1-x TiO 3 thin films varies with the films compositions. Among the compositions of Ba x Sr 1-x TiO 3 films with different Ba/Sr ratios, Ba 0.6 Sr 0.4 TiO 3 has the highest dielectric constants and the shortest dielectric relaxation time.
ISSN:0885-3010
1525-8955
DOI:10.1109/TUFFC.2011.2084