A linear optical method for measuring the carrier envelope offset phase

A linear optical method is demonstrated for extracting the carrier-envelope offset phase via the fringe visibility in a combined two-path multi-path interferometer. This method is applicable to a wider class of lasers than f-to-2f interferometry.

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Bibliographic Details
Published in2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science pp. 1 - 2
Main Authors Osvay, K., Gorbe, M., Grebing, C., Steinmeyer, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2008
Subjects
Fiber nonlinear optics
Frequency
Nonlinear optics
Optical interferometry
Optical mixing
Oscillators
Phase measurement
Pulse measurements
Resonance
Ultrafast optics
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Summary:A linear optical method is demonstrated for extracting the carrier-envelope offset phase via the fringe visibility in a combined two-path multi-path interferometer. This method is applicable to a wider class of lasers than f-to-2f interferometry.
ISBN:1557528594
9781557528599
DOI:10.1109/CLEO.2008.4551535