APA (7th ed.) Citation

Wang, X., Cheng, B., Millar, C., Reid, D., & Asenov, A. (2014, October). Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability. 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 1-3. https://doi.org/10.1109/ICSICT.2014.7021284

Chicago Style (17th ed.) Citation

Wang, Xingsheng, Binjie Cheng, Campbell Millar, Dave Reid, and Asen Asenov. "Statistical Aspects of FinFET Based SRAM Metrics Subject to Process and Statistical Variability." 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Oct. 2014: 1-3. https://doi.org/10.1109/ICSICT.2014.7021284.

MLA (9th ed.) Citation

Wang, Xingsheng, et al. "Statistical Aspects of FinFET Based SRAM Metrics Subject to Process and Statistical Variability." 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Oct. 2014, pp. 1-3, https://doi.org/10.1109/ICSICT.2014.7021284.