Scanning probe optical microscopy using an integrated submicron organic photodetector

A high-resolution scanning optical microscopy technique is developed by using focused ion beam milling and vacuum thermal evaporation to fabricate an organic photodetector with sub-micron size on a scanning probe cantilever. Optical and topographic data are recorded simultaneously and demonstrate su...

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Bibliographic Details
Published in2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science pp. 1 - 2
Main Authors Kwang Hyup An, O'Connor, B., Pipe, K.P., Yiying Zhao, Shtein, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2008
Subjects
(040.5160) Photodetectors
(120.4640) Optical instruments
(180.5810) Scanning microscopy
Atom optics
Atomic force microscopy
Biomedical optical imaging
Integrated optics
Ion beams
Optical microscopy
Optical recording
Particle beam optics
Photodetectors
Probes
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Summary:A high-resolution scanning optical microscopy technique is developed by using focused ion beam milling and vacuum thermal evaporation to fabricate an organic photodetector with sub-micron size on a scanning probe cantilever. Optical and topographic data are recorded simultaneously and demonstrate sub-micron resolution. Potential applications of the probe include materials characterization, biology, and nanophotonics, and are aided by the fact that the probe is compatible with conventional atomic force microscopy (AFM) systems and does not suffer some of the practical difficulties of existing near-field scanning optical microscopy (NSOM) systems.
ISBN:1557528594
9781557528599
DOI:10.1109/CLEO.2008.4551478