An area effective forward/reverse body bias generator for within-die variability compensation

To compensate the die-to-die and location correlated variation, we propose to split digital circuit to sub-mm-scale area controlling each area with an on-chip forward/reverse body bias generator (BBG). The proposed BBG is configured as a feedforward control system to achieve small area. The BBG is r...

Full description

Saved in:
Bibliographic Details
Published inIEEE Asian Solid-State Circuits Conference 2011 pp. 217 - 220
Main Authors Kamae, N., Tsuchiya, A., Onodera, H.
Format Conference Proceeding
LanguageEnglish
Japanese
Published IEEE 01.11.2011
Subjects
Body bias
Charge pumps
Clocks
CMOS
Delay
forward bias
Generators
Logic gates
reverse bias
substrate island
Substrates
Switches
variability compensation
Online AccessGet full text

Cover

More Information
Summary:To compensate the die-to-die and location correlated variation, we propose to split digital circuit to sub-mm-scale area controlling each area with an on-chip forward/reverse body bias generator (BBG). The proposed BBG is configured as a feedforward control system to achieve small area. The BBG is realized by combining a low output resistance DAC and a charge pump type level shifter. The BBG design is implemented with 1.2V thin gate oxide MOSFET in a 65nm CMOS technology. The simulation and measurement results show that the variation is compensated with an area overhead as small as 2%.
ISBN:9781457717840
1457717840
DOI:10.1109/ASSCC.2011.6123641