Testing and Calibration of SAR ADCs by MCT-Based Bit Weight Extraction

In this paper, a bit weight extraction technique is proposed to test and calibrate the successive approximation register (SAR) analog-to-digital converter (ADC). The proposed technique is based on major carrier transition (MCT) testing, the MCTs are generated through simple capacitor switching and t...

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Bibliographic Details
Published in2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop pp. 1 - 4
Main Authors Xuan-Lun Huang, Hung-I Chen, Jiun-Lang Huang, Chang-Yu Chen, Tseng Kuo-Tsai, Ming-Feng Huang, Yung-Fa Chou, Ding-Ming Kwai
Format Conference Proceeding
LanguageEnglish
Japanese
Published IEEE 01.05.2012
Subjects
ADC calibration
ADC testing
Approximation methods
Calibration
capacitor mismatch
Capacitors
Linearity
major-carrier testing
Registers
SAR ADC
Simulation
Testing
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Summary:In this paper, a bit weight extraction technique is proposed to test and calibrate the successive approximation register (SAR) analog-to-digital converter (ADC). The proposed technique is based on major carrier transition (MCT) testing, the MCTs are generated through simple capacitor switching and then measured by the embedded comparator and a coarse design-for-test (DfT) digital-to-analog converter (DAC) that couples to the capacitor DAC (CDAC). From the results, the individual bit weights are extracted and the ADC performance can thus be estimated and calibrated. Simulation results show very high test accuracy and linearity improvement can be achieved by the proposed technique.
ISBN:1467319252
9781467319256
DOI:10.1109/IMS3TW.2012.11