Growth of Ca3Ta(Ga0.5Al0.5)3Si2O14 piezoelectric single crystal and the piezoelectric properties

• Published in: 2014 Joint IEEE International Symposium on the Applications of Ferroelectric, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy pp. 1 - 3
• Main Authors: Kudo, Tetsuo, Shoji, Yasuhiro, Ohashi, Yuji, Medvedev, Andrey, Kurosawa, Shunsuke, Yoshikawa, Akira, Yokota, Yuui, Kamada, Kei
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.08.2014
• Subjects: Chemicals; Crystal Growth; Crystals; Langasite; Lattices; Piezoelectric Material; Powders; Single Crystal; Temperature; Temperature sensors; X-ray scattering
• DOI: 10.1109/ISAF.2014.6922990
• ISSN: 1099-4734

We grew Ca 3 Ta(Ga 0.5 Al 0.5 ) 3 Si 2 O 14 piezoelectric single crystal with a diameter of 1 inch by Czochralski method and the physical properties were investigated. The grown crystal indicated high transparency with the yellow color. In addition, there was no crack in the crystal. By the powder X-ray diffraction measurement, the grown crystal was a single phase of langasite-type structure and lattice parameters, a- and c-axes lengths, were decreased by the Al substitution. The back-reflection Laue image revealed that the grown crystal was single crystal and crystalline facets derived from (0 0 1) plane. Actual chemical composition of grown crystal was little different from the nominal composition with stoichiometric composition.