Growth of Ca3Ta(Ga0.5Al0.5)3Si2O14 piezoelectric single crystal and the piezoelectric properties

We grew Ca 3 Ta(Ga 0.5 Al 0.5 ) 3 Si 2 O 14 piezoelectric single crystal with a diameter of 1 inch by Czochralski method and the physical properties were investigated. The grown crystal indicated high transparency with the yellow color. In addition, there was no crack in the crystal. By the powder X...

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Published in2014 Joint IEEE International Symposium on the Applications of Ferroelectric, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy pp. 1 - 3
Main Authors Kudo, Tetsuo, Shoji, Yasuhiro, Ohashi, Yuji, Medvedev, Andrey, Kurosawa, Shunsuke, Yoshikawa, Akira, Yokota, Yuui, Kamada, Kei
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2014
Subjects
Chemicals
Crystal Growth
Crystals
Langasite
Lattices
Piezoelectric Material
Powders
Single Crystal
Temperature
Temperature sensors
X-ray scattering
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Summary:We grew Ca 3 Ta(Ga 0.5 Al 0.5 ) 3 Si 2 O 14 piezoelectric single crystal with a diameter of 1 inch by Czochralski method and the physical properties were investigated. The grown crystal indicated high transparency with the yellow color. In addition, there was no crack in the crystal. By the powder X-ray diffraction measurement, the grown crystal was a single phase of langasite-type structure and lattice parameters, a- and c-axes lengths, were decreased by the Al substitution. The back-reflection Laue image revealed that the grown crystal was single crystal and crystalline facets derived from (0 0 1) plane. Actual chemical composition of grown crystal was little different from the nominal composition with stoichiometric composition.
ISSN:1099-4734
2375-0448
DOI:10.1109/ISAF.2014.6922990