A new method for the determination of the oxygen content of YBa2Cu3O7-x epitaxial thin films using NIR-excited FT Raman spectrometry

Saved in:
Bibliographic Details
Published inSuperconductor science & technology Vol. 4; p. 199
Main Authors Guttler, B, Sawatzki, J, Richter, W
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.05.1991
Online AccessGet full text

Cover

More Information
ISSN:0953-2048
1361-6668
DOI:10.1088/0953-2048/4/5/004