Surface structural analysis of SrF2(111) using low-energy atom scattering spectroscopy

We studied the surface structure of SrF2(111) using low-energy atom scattering spectroscopy. For the spectroscopy, we used pulsed 3 keV 4He° and 3 keV 20Ne0 beams as incident particles and detected 180° backscattered particles using a microchannel plate. We compared the experimental results with sim...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 63; no. 2; pp. 025505 - 25514
Main Authors Fukuta, Hiroaki, Tan, Goon, Oga, Tomoaki, Matsuda, Akifumi, Yoshimoto, Mamoru, Matsuura, Hiroto, Umezawa, Kenji
Format Journal Article
LanguageEnglish
Published Tokyo IOP Publishing 29.02.2024
Japanese Journal of Applied Physics
Subjects
low-energy atom scattering spectroscopy
Microchannel plates
Microchannels
Particle beams
Scattering
SrF
Strontium fluorides
Structural analysis
Structural models
Surface structure
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Summary:We studied the surface structure of SrF2(111) using low-energy atom scattering spectroscopy. For the spectroscopy, we used pulsed 3 keV 4He° and 3 keV 20Ne0 beams as incident particles and detected 180° backscattered particles using a microchannel plate. We compared the experimental results with simulations employing three types of surface atomic structural models: F–Sr–F, Sr–F–F, and F–F–Sr Our results demonstrate that the topmost layer of SrF2(111) has approximately 60% and 40% of F–Sr–F and Sr–F–F, respectively.
Bibliography:JJAP-105446.R2
ISSN:0021-4922
1347-4065
DOI:10.35848/1347-4065/ad226f