In-flight observations of long-term single event effect (SEE) performance on X-ray Timing Explorer (XTE) solid-state recorders (SSRs) [SRAM]
We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models.
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Published in | 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) pp. 54 - 57 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
New York NY
IEEE
2004
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Subjects | |
Online Access | Get full text |
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Summary: | We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models. |
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ISBN: | 0780386973 9780780386976 |
DOI: | 10.1109/REDW.2004.1352904 |