In-flight observations of long-term single event effect (SEE) performance on X-ray Timing Explorer (XTE) solid-state recorders (SSRs) [SRAM]

We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models.

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Bibliographic Details
Published in2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) pp. 54 - 57
Main Authors Poivey, C., Gee, G., LaBel, K.A., Barth, J.L.
Format Conference Proceeding
LanguageEnglish
Published New York NY IEEE 2004
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Error correction codes
Exact sciences and technology
Integrated circuits
NASA
Predictive models
Protons
Radiation effects
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Single event upset
Solid state circuits
Space vehicles
Testing
Timing
Performance evaluation
Single event upset
Radiation effect
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Summary:We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models.
ISBN:0780386973
9780780386976
DOI:10.1109/REDW.2004.1352904