Novel measurement methods for in-depth analysis of AC metallized film capacitors

Metallized film capacitors with self-healing properties become increasingly relevant for high voltage power applications due to their high capacitance density, high power density, and inherent safety. However, because of a lack of generic design rules, introduction of new capacitor designs requires...

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Bibliographic Details
Published inConference Record of the 2004 IEEE International Symposium on Electrical Insulation pp. 568 - 571
Main Authors Fuhrmann, H., Carlen, M., Chartouni, D., Christen, T., Ohler, C., Votteler, T.
Format Conference Proceeding
LanguageEnglish
Published Piscataway NJ IEEE 2004
Subjects
Accelerated aging
Applied sciences
Capacitance measurement
Capacitors
Capacitors. Resistors. Filters
Circuits
Current measurement
Dielectric measurements
Electrical engineering. Electrical power engineering
Exact sciences and technology
Metallization
Polymer films
Testing
Testing. Reliability. Quality control
Various equipment and components
Voltage
Power density
Metallic thin films
High power
High voltage
High density
Aging test
Ageing
Capacitance
Power capacitor
Measurement method
Safety
Built in self repair
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Summary:Metallized film capacitors with self-healing properties become increasingly relevant for high voltage power applications due to their high capacitance density, high power density, and inherent safety. However, because of a lack of generic design rules, introduction of new capacitor designs requires time-consuming aging tests. We present a novel toolkit of measurement methods with the purpose of gaining a deeper knowledge on aging mechanisms and decreasing the development time for new capacitor designs.
ISBN:9780780384477
0780384474
ISSN:1089-084X
DOI:10.1109/ELINSL.2004.1380700