Novel measurement methods for in-depth analysis of AC metallized film capacitors
Metallized film capacitors with self-healing properties become increasingly relevant for high voltage power applications due to their high capacitance density, high power density, and inherent safety. However, because of a lack of generic design rules, introduction of new capacitor designs requires...
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Published in | Conference Record of the 2004 IEEE International Symposium on Electrical Insulation pp. 568 - 571 |
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Main Authors | , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
Piscataway NJ
IEEE
2004
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Subjects | |
Online Access | Get full text |
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Summary: | Metallized film capacitors with self-healing properties become increasingly relevant for high voltage power applications due to their high capacitance density, high power density, and inherent safety. However, because of a lack of generic design rules, introduction of new capacitor designs requires time-consuming aging tests. We present a novel toolkit of measurement methods with the purpose of gaining a deeper knowledge on aging mechanisms and decreasing the development time for new capacitor designs. |
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ISBN: | 9780780384477 0780384474 |
ISSN: | 1089-084X |
DOI: | 10.1109/ELINSL.2004.1380700 |