Radiation pattern characterisation setup for G-band planar Yagi antennas

On-wafer radiation pattern characterisation test structure for G-band planar Yagi antennas is presented in this paper. It employs a number of identical planar Yagi antennas (one as a receiver and surrounded by multi transmitters) fabricated on the same substrate. On-wafer measurements are done using...

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Bibliographic Details
Published in2nd IET Annual Active and Passive RF Devices Seminar p. 1
Main Authors Alharbi, K.H, Ofiare, A, Wang, J, Khalid, A, Cumming, D, Wasige, E
Format Conference Proceeding
LanguageEnglish
Published Stevenage, UK IET 2014
The Institution of Engineering & Technology
Subjects
Network and spectrum analysers
Single antennas
receiver-transmitter antenna configuration
identical G-band planar Yagi antenna
transmitting antennas
VNA
reflector geometry optimization
antenna radiation pattern characterisation
vector network analyser
radiation intensity measurement
intensity measurement
antenna testing
receiving antennas
antenna radiation patterns
on-wafer radiation pattern characterisation test structure
network analysers
on-wafer measurement
front-to-back ratio
planar antennas
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Summary:On-wafer radiation pattern characterisation test structure for G-band planar Yagi antennas is presented in this paper. It employs a number of identical planar Yagi antennas (one as a receiver and surrounded by multi transmitters) fabricated on the same substrate. On-wafer measurements are done using a Vector Network Analyser (VNA) to measure the radiation intensity at the different receiver-transmitter antenna configurations. Measured and simulated radiation patterns are in a good agreement. The designed planar Yagi antenna shows very wide bandwidth (S11< -10 dB) over the whole G-band. Higher front-to-back ratio could be obtained through optimised reflector geometry.
ISBN:9781849199728
1849199728
DOI:10.1049/ic.2014.0180