Automated debugging from pre-silicon to post-silicon

Due to the increasing design size and complexity of modern Integrated Circuits (IC) and the decreasing time-to-market, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a generalized approach to automate debugging which can be used in different scenarios from...

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Bibliographic Details
Published in2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) pp. 324 - 329
Main Authors Dehbashi, M., Fey, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2012
Subjects
Accuracy
Circuit faults
Computer bugs
Debugging
Hardware
Integrated circuit modeling
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Summary:Due to the increasing design size and complexity of modern Integrated Circuits (IC) and the decreasing time-to-market, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a generalized approach to automate debugging which can be used in different scenarios from design debugging to post-silicon debugging. The approach is based on model-based diagnosis. Diagnostic traces are proposed as an enhancement reducing debugging time and increasing diagnosis accuracy. The experimental results show the effectiveness of the approach in post-silicon debugging.
ISBN:9781467311878
1467311871
DOI:10.1109/DDECS.2012.6219082