Integrated near field scaning system for high frequency deivces

In electromagnetic interference (EMI) investigation, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary three-dimension (3D) shape of h...

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Bibliographic Details
Published inProceedings of 2014 3rd Asia-Pacific Conference on Antennas and Propagation pp. 1447 - 1450
Main Authors Hengxu Li, Boyuan Zhu, Varnoosfadeani, M. Vatankhah, Junwei Lu
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2014
Subjects
3D scanning
Antenna measurements
Antennas
FEM simulation
Finite element analysis
integrated system
near-field
Numerical models
Solid modeling
Switches
Three-dimensional displays
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Summary:In electromagnetic interference (EMI) investigation, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary three-dimension (3D) shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) based numerical simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.
DOI:10.1109/APCAP.2014.6992801